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This comprehensive textbook, "Modern Optical Research and Measurements," by Vladimir Kirillovsky, offers an in-depth exploration of contemporary methods and tools used in optical measurements and research. The book details techniques for determining sensitivity thresholds and assessing the accuracy characteristics of various optical methods and equipment.
The text highlights innovative directions in optical measurements, including the analysis and synthesis of new circuit solutions for computerized apparatus designed to study aberrations and errors in optical systems and surfaces. It also covers methods and equipment for determining image quality characteristics. The algorithmic and software solutions presented enable the powerful capabilities of efficient control methods, such as shear interferometry and cumulative isophotometry.
Written in accordance with the Federal academic discipline program "Optical Measurements," this textbook is intended for university students pursuing degrees in "Optical Engineering" (Bachelor's, Master's, and Specialist levels). It is also of interest to scientists and specialists working in the fields of optics and instrument engineering. The book provides a solid foundation for understanding both theoretical principles and practical applications in modern optical metrology.